Polycrystalline phosphor film Cd(1-x-y-z) (CuyAgz) ZnxS was
grown on the surface of
the Si/nano-SiC heterostructure obtained by the unique method of substitution of atoms. The
structural, phonon (vibrational) properties of the film, as well as its morphology were studied.
X-ray phase analysis (XRD) showed that the phase composition is represented by a matrix of
solid solution of cubic syngony and impurity phases formed during precipitation: sodium
sulfate (Na2SO4) of orthorhombic syngony and sodium cadmium sulfide
monoclinic syngony. The Raman spectroscopy (RS) method confirmed the components of the
polycrystalline phosphor film, including its phase composition, determined by the X-ray
phase analysis method.
Keywords: phosphor, ód1-xZnxS, copper, silver, polycrystalline film, Si/(nano)SiC heterostructures, Raman spectroscopy
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